IUVSTA Prize in Science


Prof.Joost W. M. Frenken

Joost W. M. Frenken
Kamerlingh Onnes Laboratory
Leiden Institute of Physics
Leiden University
P.O. Box 9504
2300 RA Leiden
The Netherlands
MOTIVATION: For his pioneering work in the development and application of scanning probe microscopy to study various dynamical processes at surfaces.
Title of the Lecture: Direct Observation of Dynamic Surface Processes with Scanning Probes
Short biography

Joost W.M. Frenken is a Full Professor at the Physics Department (LION) of Leiden University, The Netherlands, where he is head of the Interface Physics Group and currently chairs the Condensed Matter Section. Frenken obtained his M.Sc. in Physics at the University of Amsterdam in 1982 and his Ph.D. in Physics from the University of Utrecht in 1986. His Ph.D. project was carried out at the FOM-Institute for Atomic and Molecular Physics in Amsterdam. From 1986 to 1988, Frenken worked as an Alexander-von-Humboldt Fellow at the Max-Planck-Institut f ü r Str ö mungsforschung in G ö ttingen (Germany). After a short stay in 1988 at the IBM, Thomas J. Watson Research Centre in Yorktown Heights, Frenken started his own research group at the FOM-Institute for Atomic and Molecular Physics in Amsterdam, first as a C. and C. Huygens Fellow and later as a regular staff member. In 1994, Frenken was appointed Extraordinary Professor at Leiden University, and in 1996 he moved to the Kamerlingh Onnes Laboratory in Leiden as a regular (full) Professor. Frenken serves on a variety of national and international committees and boards, is a past-chairman of the Dutch Association for Crystal Growth, president of the Netherlands Vacuum Society, and chairman of the Condensed Matter Division of FOM, the Dutch national physics funding agency. In 1985, Frenken won the Nottingham Prize (45 th PEC meeting, Milwaukee), and in 1996 he was awarded a “Pionier” personal research grant from the Netherlands Organization for Scientific Research (NWO).

Central to the research of Joost Frenken are the dynamic aspects of surfaces and interfaces. Topics of interest include surface diffusion, crystal growth, surface phase transitions, model catalysis, nanotribology, and biomembranes. For tailor-made measurements in each of these areas, Frenken's research group has developed a variety of special-purpose scanning probe microscopes.

IUVSTA Prize in Technology

Prof.Martin P. Seah
Martin P. Seah
Centre for Optical and Analytical Metrology
National Physical Laboratory
Middlesex, UK TW11 OLW
MOTIVATION: For his contribution to the science, technology and application of surface chemical analysis.
Title of the Lecture: The Development of Quantitative Analysis by AES and XPS via Four Experimental Data Bases and an Interlaboratory Study
Short biography

Martin Seah is Head of Surface and Nano-Analysis Science at National Physical Laboratory (NPL). This area covers the measurement infrastructure for surface analysis for atoms, molecules and complex molecules at surfaces in the range from one atom layer up to 10 nm thickness as well as the identification of nano-regions. Current activities include Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), static secondary ion mass spectrometry (SSIMS), the newly developed G-SIMS, and atomic force microscopy (AFM). Issues concerning method development, instrumental calibration, reference materials and data, basic science of the method and ISO documentary standards are all a major focus.
In the late 1960's, at the University of Warwick, Martin published work separating different elastic and inelastic electron scattering processes at the surfaces of clean metals. In 1969 he joined NPL to work with E D Hondros on the measurement of segregation in metallurgy. This led to the basic predictive relationships for both surface and grain boundary segregations. During this period, quantification at surfaces became important. In 1980, Martin started a basic programme to underpin measurements generally in surface analysis. So developed a systematic work to calibrate energy and intensity scales for AES and XPS, basic issues for quantification and the development of new algorithms validated using new, traceable databases for AES and XPS. Many will know of his work through involvement in one of his many interlaboratory studies. His work covered the first traceable certified reference material for high resolution depth profiling, the first ISO standard in this area and the International Conference on Quantitative Surface Analysis. A recent development with I S Gilmore, is G-SIMS, a variant of SSIMS to allow SIMS to be used to identify complex molecules in fields where no reference spectra are available.
Martin Seah is active on many committees, including ISO, VAMAS, conference organisations and CCQM. In ISO TC 201 on Surface Chemical Analysis, he has been the project leader so far for 10 standards. In VAMAS, and more recently in CCQM, he has organised many interlaboratory studies that include up to 50 laboratories.

Martin Seah is well known for the popular books Practical Surface Analysis Vol 1 - Auger and Photoelectron Spectroscopies and Vol 2 - Ion and Neutral Spectroscopies Edited with David Briggs and published by John Wiley in 1990 and 1992, respectively. More information on the work of the group may be found at



Endowment for the Prize is provided by generous donations from:

Omicron Nanotechnology GmbH
Osaka  Vacuum
Physical Electronic USA
Saes getters



Elsevier Student Travel Awards
Elsevier Physics

These prizes will be awarded to a number of students/young scientists giving a presentation at IVC-16/ICSS-12/NANO-8/AIV-17.
A student/young scientist is defined as a person who has not yet obtained a Ph.D. or who obtained a Ph.D. within the last three years. The student/young scientist must be the presenting author of the contribution.
A committee of referees will judge the competition primarily on the basis of the extended abstracts.
During the IUVSTA/AIV Awards ceremony (June 28, 2004), the winners of the Elsevier Student Travel Award will be awarded of a certificate.For general info, please visit http:/



AIV (Associazione Italiana del Vuoto) Prizes and Honorary Membership

AIV Honorary Membership
This AIV honor was established to recognize an individual who has performed important service to AIV (Italian Vacuum Society) or who has made outstanding contributions in the sciences and technologies of interest to AIV. The award consists of a certificate.

Mr.Glauco Gambetti

Mr. Glauco Gambetti , G. GAMBETTI KENOLOGIA S.R.L., Binasco, Milano, Italy, “ for his long standing contribution to the advancement of vacuum technology in Italy.

Glauco Gambetti was born in Milan on August 22, 1935. He graduated in chemistry at the “Ettore Molinari” Istitute in Milan (Italy). After short different work experiences, he joined the company “Ormonoterapia” as a technician expert in controlling and handling freeze drying systems for drug process (1957-1959).

After this experience, he became Technical Sales Responsible for (Vacuum) Officine Galileo in the Lombardia area (1960-1964). In 1965, with the aim to operate with an international vacuum company, he joined Balzers-Italia where he became Technical Sales Manager. In January 1974, he founded his own company “G. Gambetti-Kenologia s.r.l” having the mission to sell vacuum components and systems of many international producers, closely and professionally supporting customers in installation and maintenance. He has served AIV (Italian Vacuum Society), for more than 25 years, from different managing responsibility positions.


Maria Grazia Cattania Memorial Award

The AIV Maria Grazia Cattania Memorial Award was established to commemorate the pioneering work of Maria Grazia Cattania in the domain of Applied Surface Science. It is presented to recognize AIV (Italian Vacuum Society) members who gave outstanding theoretical or experimental contributions in the field of Applied Surface Science. The award consists of a Euro 1500 cash award and a commemorative plaque.

Prof.Sergio Valeri

Prof. Sergio Valeri , INFM, National Research Center on nanoStructures and bioSystems at Surfaces (S3), and Dipartimento di Fisica, Università di Modena e Reggio Emilia, Modena, Italy, for his long standing contribution to the application of surface science techniques to the study of industrial and materials processing issues.

Sergio Valeri received his degree in Physics from the University of Bologna in 1972. In 1982 he became Associated Professor at the University of Modena. Since November 2002 he is Full Professor at the University of Modena e Reggio Emilia.

His main fields of scientific activity are: i) electronic and magnetic properties of solid surfaces, interfaces and low-dimensional systems; ii) interaction of energetic particles (mainly ions) with solid surfaces; iii) development of electron spectroscopies (also using synchrotron radiation).

This activity has been developed in cooperation with several Universities and Laboratories in Italy and in foreign countries, in particular at the KFA-Julich (Germany) and at the FOM-Amsterdam (The Netherlands). Professor Valeri was involved (for both science and management) in the build-up and development of the Laboratory for Electron Spectroscopy of Surfaces and Adsorbates in Modena (SESAMo). He collaborates with international Metrology Institutes (NBS-USA, NPL-UK) in the frame of European Projects for the quantitative standardisation of electron spectroscopies. He was scientific manager of CNR-Project MSTA, of PRIN 1997, 1999, 2003, and of PRA-ISADORA of INFM, in the field of materials for microelectronics and spintronics. He is presently involved in a number of European projects, FIRB and industrial projects, and in charge of the Division “Nanostructured magnetic surfaces and materials” of the INFM - National Research Center on nanoStructures and bioSystems at Surfaces (S3).

He is referee of international scientific journals and of European Projects. Finally, Prof. Valeri was involved in applied research with a number of companies in micro-nanoelectronics, micro-nanomechanics, aerospace and biomedical. He is author or co-author of about 140 refereed papers on international journals.


IUVSTA Welch Scholarships

The M. W. Welch International Scholarship was established in 1965 to support younger scientists working abroad in vacuum science and technology. The scholarship was made possible by support from M.W. Welch, and the Welch family continues to provide funds annually. The first scholar was chosen in 1968, and scholars have been identified each year since then. The scholarship amounts to $15,000 per year. During the IUVSTA/AIV Awards ceremony (June 28, 2004), the winners of the IUVSTA Welch Scholarships of the triennium 2001-2004 will be awarded of a certificate.
For more details, please see

IUVSTA Welch Scholarships (Triennium 2001-2004)

2002 Muhammad Tawalbeh (Jordan)

2003 Rafi Shikler (Israel)

2004 Maksim Kireitseu (Belarus)


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